Publications

A. EDITED WORKS AND BOOK CHAPTERS

(a) Government Reports


1. Committee on Smaller Facilities: R. Sinclair (chair), A. Aprahamian, A. I. Bienenstock, J. P. Bradley, D. R. Clarke, J. W. Davenport, F. J. DiSalvo, C. A. Evans, Jr., W. P. Lowe, F. M. Ross, D. J. Smith, J. M. Soures, L. Spicer, D. M. Tennant. National Research Council of the National Academy of Sciences. Midsize Facilities: the Infrastructure for Materials Research. Washington: National Academies Press, pp. 1-230 2006.

(b) Edited Works


1."Report of Workshop on High Resolution Electron Microscopy," edited by G. Thomas, R. M. Glaeser, J. M. Cowley and R. Sinclair (Lawrence Berkeley Laboratory, Special Publication #106, 1976).
2. "Characterization of Defects in Materials", edited by R. W. Siegel, J. R. Weertman and R. Sinclair, Mat. Res. Soc. Symp. Proc. 82, pp. 1-532 (1987).
3. "High Resolution Electron Microscopy of Defects in Materials", edited by R. Sinclair, D. J. Smith and U. Dahmen, Mat. Res. Soc. Symp. Proc. 183, pp. 1-391 (1990).
4. "Polycrystalline Thin Films-Structure, Texture, Properties and Applications", edited by K. Barmak, M. A. Parker, J. F. Floro, R. Sinclair and D. A. Smith, Mat. Res. Soc. Symp. Proc. 343, pp. 1-769 (1994).
5. "In Situ Electron and Tunneling Microscopy of Dynamic Processes", edited by R. Sharma, P. L. Gai, M. Gajdardziska-Josifovska, L. J. Whitman and R. Sinclair, Mat. Res. Soc. Symp. Proc. 404, pp. 1-226 (1996).

(c) Book Chapters


1. "Direct Observation and Characterization of Lattice Defects in Materials," R. Sinclair, in Treatise on Materials Science and Technology, Volume 11, edited by R. K. McCrone (Academic Press, New York, 1977) pp. 1-45.
2. "Microanalysis by Lattice Imaging," R. Sinclair, in Analytical Electron Microscopy, edited by J. J. Hren, J. I. Goldstein and D. C. Joy (Plenum Press, New York, 1979) pp. 507-534.
3. "Recent Developments in Lattice Imaging of Materials", R. Sinclair, in Annual Reviews of Materials Science, Volume 11, edited by R. A. Huggins (Annual Reviews, Inc., Palo Alto, California, 1981) pp. 427-439.
4. "High Resolution Electron Microscopy", R. Sinclair, in Quantitative Electron Microscopy, edited by J.N. Chapman and A.J. Craven (SUSSP Publications, Edinburgh, 1984) pp. 341-350.
5. "Electron Microscope", R. Sinclair, in 1987 Yearbook of Science and Technology, (McGraw-Hill, New York, 1986) pp. 173-176.
6. "Thermochemical Properties and Phase Diagrams", R. Sinclair, R. Madar and M. Setton, in Properties of Metal Silicides, edited by K. Maex and M. van Rossum (Inst. Elec. Eng'rs, London, 1995), pp. 95 - 152.

B. JOURNAL PUBLICATIONS (refereed)


1. "Structural Studies on the Ni-Ni3Ti System", R. Sinclair, Ph.D. Thesis, University of Cambridge, England (1972).
2. "Measurement of Relative Bond Energies in Some Ordered Nickel-Based Alloys by Field-Ion Microscopy", R.J. Taunt, R. Sinclair and B. Ralph, Phys. Status Solidi A, 16, pp. 469-484 (1973).
3. "On the Determination of a Local Order Parameter in a Nickel-Titanium Alloy", R. Sinclair, B. Ralph and J.A. Leake, Philos. Mag., 28, pp. 1111-1123 (1973).
4. "Spinodal Decomposition of a Nickel-Titanium Alloy", R. Sinclair, J.A. Leake and B. Ralph, Phys. Status Solidi A, 26, pp. 285-298 (1974).
5. "Antiphase Domains and Diffraction Spot Splitting in Cu3Au", R. Sinclair and G. Thomas, J. Appl. Crystallography, 8, pp. 206-211 (1975).
6. "On the Lattice Parameter of Non-Random Solid Solutions", A. Krawitz and R. Sinclair, Philos. Mag., 31, pp. 697-712 (1975).
7. "Analysis of Ordering in Cu3Au, Utilizing Lattice Imaging Techniques", R. Sinclair, K. Schneider and G. Thomas, Acta Metall., 23, pp. 873-883 (1975).
8. "Applications of the Critical Voltage Effect for the Study of Ordering", R. Sinclair, M.J. Goringe and G. Thomas, Philos. Mag., 32, pp. 501-512 (1975).
9. "Optical Diffraction from Lattice Images of Alloys", R. Sinclair, R. Gronsky and G. Thomas, Acta Metall., 24, pp. 789-795 (1976).
10. "Observations of B19 Order ing in Mg3Cd Thin Foils", J. Dutkiewicz and R. Sinclair, Scripta Met., 10, pp. 489-493 (1976).
11. "Discussion of An Electron Diffraction Study of Short-Range Order in Quenched Ni4Mo Alloy", G. Thomas and R. Sinclair, Acta Metall., 25, pp. 231-234 (1977).
12. "Lattice Image Studies of B19 Ordering and Interfacial Structures in Mg3Cd", R. Sinclair and J. Dutkiewicz, Acta Metall., 25, pp. 235-249 (1977).
13. "The Importance of Electron Diffraction to Transmission Electron Imaging", R. Sinclair, Trans. Am. Cryst. Soc., 13, pp. 101-126 (1977).
14. "Structure of Ordered Alloys", R. Sinclair and G. Thomas, J. Phys. (Paris), 38, C7, pp. 165-171 (1977).
15. "A Preliminary Lattice Image Investigation of Nickel-Titanium Martensite", R. Sinclair, J. Phys. (Paris), 38, C7, pp. 453-456 (1977).
16. "Lattice Imaging and Optical Microanalysis of a Cu-Ni-Cr Spinodal Alloy", C. K. Wu, R. Sinclair and G. Thomas, Met. Trans., 9A, pp.381-387 (1978).
17. "Determination of Local Composition by Lattice Imaging", R. Sinclair and G. Thomas, Met. Trans., 9A, pp. 373-380 (1978).
18. "Lattice Imaging Study of a Martensite-Austenite Interface", R. Sinclair and H.A. Mohamed, Acta Metall., 26, pp. 623-628 (1978).
19. "Modulated Substitutional-Intersitial Solute-Atom Clustering in Nitrided Austenitic Fe-34 Ni-V Alloys", J.H. Driver, R. Sinclair and K.H. Jack, Proc. R. Soc. London, A367, pp. 99-115 (1978).
20. "Comments on 'The Early Stages of the Transformation in Dilute Alloys of Titanium in Nickel'", D.E. Laughlin, R. Sinclair, and L.E. Tanner, Scripta Met., 14, pp. 373-376 (1980).
21. "A Quantitative Assessment of the Capabilities of 2 1/2 D Microscopy for Analyzing Crystalline Solids", G. M. Michal and R. Sinclair, Philos. Mag., A42, pp. 691-704 (1980).
22. "Metallurgical Applications of the 2 1/2 D TEM Technique", R. Sinclair, G.M. Michal and T. Yamashita, Met. Trans., 12A, pp. 1503-1512 (1981).
23. "Atomic Motion on the Surface of a Cadmium Telluride Single Crystal", R. Sinclair, T. Yamashita and F.A. Ponce, Nature, 290, pp. 386-388 (1981).
24. "Room Temperature Deformation Mechanisms and the Defect Structure of Tungsten Carbide", M.K. Hibbs and R. Sinclair, Acta Metall., 29, pp. 1645-1654 (1981).
25. "Native Tellurium Dioxide Layer on Cadmium Telluride: A High Resolution Electron Microscopy Study", F.A. Ponce, R. Sinclair and R.H. Bube, Appl. Phys. Lett., 39, pp. 951-953 (1981).
26. "The Effect of Orientation, Grain Size and Polymorphism on Magnetic Properties of Sputtered Co-Re Thin Film Media", T. Chen, T. Yamashita and R. Sinclair, IEEE Trans. Magn., MAG-17, pp. 3187-3189 (1981).
27. "The Structure of TiNi Martensite", G.M. Michal and R. Sinclair, Acta Crystallogr. B, 37, pp. 1803-1807 (1981).
28. "A Morphological Study of 'Premartensitic' Effects in TiNi," P. Moine, G.M. Michal and R. Sinclair, Acta Metall., 30, pp. 109-123 (1982).
29. "Characterization of the Lattice Displacement Waves in Premartensitic TiNi", G.M. Michal, P. Moine and R. Sinclair, Acta Metall., 30, pp. 125-138 (1982).
30. "Electron Irradiation Induced Crystalline Amorphous Transitions in Ni-Ti Alloys", G. Thomas, H. Mori, H. Fujita and R. Sinclair, Scripta Met., 15, pp. 589-592 (1982).
31. "High Resolution Lattice Imaging of Cadmium Telluride", T. Yamashita, F.A. Ponce, P. Pirouz and R. Sinclair, Philos. Mag., A45, pp. 693-711 (1982).
32. "Dynamic Observation of Defect Annealing in CdTe at Lattice Resolution", R. Sinclair, F.A. Ponce, T. Yamashita, D.J. Smith, R.A. Camps, L.A. Freeman, S.J. Erasmus, W.C. Nixon, K.C.A. Smith and C.J.D. Catto, Nature, 298, pp. 127-131 (1982).
33. "Martensitic Transformations in a TiNi Thin Foil", P. Moine, E. Goo and R. Sinclair, J. Phys. (Paris), 43, C4, pp. 243-248 (1982).
34. "Transmission Electron Microscopy of Annealed ZrO2+8Mol%Sc2O3", F.K. Moghadam, T. Yamashita, R. Sinclair and D.A. Stevenson, J. Am. Ceram. Soc., 66, pp. 213-217 (1983).
35. "Intergranular Cracking in WC-6%Co: An Application of the von Mises Criterion", V. Jayaram, R. Sinclair and D.J. Rowcliffe, Acta Metall., 31, pp. 373-378 (1983).
36. "Transmission Electron Microscopy Studies of the Polycrystalline Silicon - SiO2 Interface", J.C. Bravman and R. Sinclair, Thin Solid Films, 104, pp. 153-161 (1983).
37. "Detection of Thin Intergranular Cobalt Layers in WC-Co Composites by Lattice Imaging", V. Jayaram and R. Sinclair, J. Am. Ceram. Soc., 66, pp. C137-C139 (1983).
38. "Defect Interactions in Deformed WC", M.K. Hibbs, R. Sinclair and D.J. Rowcliffe, Acta Metall., 32, pp. 941-947 (1984).
39. "The Preparation of Cross-Section Specimens for Transmission Electron Microscopy", J.C. Bravman and R. Sinclair, J. Electron Microsc. Tech., 1, pp. 53-61 (1984).
40. "Cadmium Telluride Films and Solar Cells" R.H. Bube, A. Fahrenbruch, R. Sinclair, T.C. Anthony, C. Fortmann, W. Huber, C-T. Lee, T. Thorpe and T. Yamashita, IEEE Trans. Electron Devices, ED-31, pp. 528-538 (1984).
41. "Thin Foil Artifacts Observed in Electron Diffraction on a TiNi Alloy", P. Moine, E. Goo and R. Sinclair, Scripta Met., 18, pp. 1143-1147 (1984).
42. "Phase Equilibria in Thin-Film Metallizations", R. Beyers, R. Sinclair and M.E. Thomas, J. Vac. Sci. Technol., B2, pp. 781-784 (1984).
43. "Metastable Phase Formation in Titanium-Silicon Thin Films", R. Beyers and R. Sinclair, J. Appl. Phys., 57, pp. 5240-5245 (1985).
44. "In Situ TEM Study of Martensitic NiTi Amorphization by Ni Ion Implantation", P. Moine, J. P. Riviere, M.O. Ruault, J. Chaumont, A. Pelton and R. Sinclair, Nucl. Instrum. Methods B, 7/8, pp. 20-25 (1985).
45. "Precipitation of Phosphorus and Tin in Temper Embrittled Low Alloy Steel", J.E. Wittig, R. Sinclair and R. Viswanathan, Scripta Met., 19, pp. 111-116 (1985).
46. "Displacement Boundaries in TiNi Alloys", E. Goo and R. Sinclair, Scripta Met., 19, pp. 1257-1259 (1985).
47. "Silicon Nitride Joining", M. L. Mecartney, R. Sinclair and R. E. Loehman, J. Am. Ceram. Soc., 68, pp. 472-478 (1985).
48. "Mechanical Twinning in Ti50Ni47Fe3 and Ti49Ni51 Alloys", E. Goo, T. Duerig, K.N. Melton and R. Sinclair, Acta Metall., 33, pp. 1725-1733 (1985).
49. "The B2 to R Transformation in Ti50Ni47Fe3 and Ti49.5Ni50.5 Alloys", E. Goo and R. Sinclair, Acta Metall., 33, pp. 1717-1723 (1985).
50. "Delineation of Emitter-Collector Shorts in Bipolar Test Structures by Voltage Contrast Scanning Electron Microscopy", A.H. Carim, R. Sinclair and W.T. Stacy, SEM 1985: III, pp. 1047-1053 (1985).
51. "Lattice Images of Defect Free Silicon-On-Sapphire Prepared by Ion Implantation", M.A. Parker, R. Sinclair and T.W. Sigmon, Appl. Phys. Lett., 47, pp. 626-628 (1985).
52. "Deformation Enhanced Decarburization of WC-Co", V. Jayaram, R. Sinclair and D.J. Rowcliffe, Scripta Met., 20, pp. 55-60 (1986).
53. "Plastic Deformation of WC-Co at High Confining Pressure", V. Jayaram, A. Kronenberg, S.H. Kirby, D.J. Rowcliffe and R. Sinclair, Scripta Met., 20, pp. 701-705 (1986).
54. "High Resolution Transmission Electron Microscope Observations of Silicon Regrowth at Controlled Elevated Temperatures", R. Sinclair and M.A. Parker, Nature, 322, pp. 531-533 (1986).
55. "The Evolution of Si/SiO2 Interface Roughness", A.H. Carim and R. Sinclair, J. Electrochem. Soc., 134, pp. 741-746 (1987).
56. "Amorphous Ti-Si Alloy Formed by Interdiffusion of Amorphous Si and Crystalline Ti Multilayers", K. Holloway and R. Sinclair, J. Appl. Phys., 61, pp. 1359-1364 (1987).
57. "Phase Equilibria in Metal-Gallium-Arsenic Systems: Thermodynamic Considerations for Metallization Materials", R. Beyers, K.B. Kim and R. Sinclair, J. Appl. Phys., 61, pp. 2195-2202 (1987).
58. "Kinetics & Oxide Composition for Thermal Oxidation of Cadmium Telluride", F. Wang, A. Schwartzman, A.L. Fahrenbruch, R. Sinclair, R.H. Bube and C.M. Stahle, J. Appl. Phys., 62, pp. 1469-1476 (1987).
59. "High-Resolution Electron Microscopy of Structural Features at the Si/SiO2 Interface", A.H. Carim and R. Sinclair, MateR. Letts., 5, pp. 94-98 (1987).
60. "High-Resolution Electron Microscopy and Scanning Tunneling Microscopy of Native Oxides on Silicon", A.H. Carim, M.M. Dovek, C.F. Quate, R. Sinclair and C. Vorst, Science, 237, pp. 630-633 (1987).
61. "In Situ HREM of Interface Reactions in Semiconductors", R. Sinclair, M.A. Parker and K.B. Kim, Ultramicroscopy, 23, pp. 383-396 (1987).
62. "Disordered Intermixing at the Platinum-Silicon Interface Demonstrated by High-resolution Cross-sectional Transmission Electron Microscopy, Auger Electron Spectroscopy and MeV Ion Channeling", J.R. Abelson, K.B. Kim, D.E. Mercer, C. R. Helms, R. Sinclair and T.W. Sigmon, J. Appl. Phys., 63, pp. 689-692 (1988).
63. "High-resolution and In Situ TEM Studies of Annealing of Ti-Si Multilayers", K. Holloway and R. Sinclair, J. Less Common Metals, 140, pp. 139-148 (1988).
64. "Structural Determination of Small Amorphous Volumes by Electron Diffraction", P. Moine, A.R. Pelton and R. Sinclair, J. Non-Cryst. Solids, 101, pp. 213-222 (1988).
65. "Interfacial Reactions in the Ti/GaAs System", K.B. Kim, M. Kniffin, R. Sinclair and C. R. Helms, J. Vac. Sci. Technol. A, 6, pp. 1473-1477 (1988).
66. "The Development of In Situ High Resolution Electron Microscopy", R. Sinclair, T. Yamashita, M.A. Parker, K.B. Kim, K. Holloway and A.F. Schwartzman, Acta Crystallogr. Sec. A, 44, pp. 965-975 (1988).
67. "Interfacial Reactions on Annealing Molybdenum-Silicon Multilayers", K. Holloway, K.B. Do and R. Sinclair, J. Appl. Phys., 65, pp. 474-480 (1989).
68. "A High-Resolution Electron Microscopy Study of the Fine Structure in a Trench Capacitor", R. Sinclair, K.B. Kim, O. Shippou and H. Iwasaki, J. Electrochem. Soc., 136, pp. 511-518 (1989).
69. "Structure and Electrical Properties of Interfaces Between Silicon Films and n+ Silicon Crystals", S. Ogawa, S. Okuda, T. Yoshida, T. Kouzaki, K. Tsukamoto and R. Sinclair, J. Appl. Phys., 65, pp. 668-671 (1989).
70. "Amorphous Silicide Formation by Thermal Reaction: A Comparison of Several Metal-Silicon Systems", K. Holloway, R. Sinclair and M. Nathan, J. Vac. Sci. Technol. A, 7, pp. 1479-1483 (1989).
71. "Morphology of the Silicon Implanted Interface of a Polysilicon/Single Crystal Silicon Structure", S. Okuda, S. Ogawa, T. Kouzaki, T. Yoshida, F. Toujou and R. Sinclair, Jpn. Nucl. Instr. Meth. Phys. Res. B, 39, pp. 334-337 (1989).
72. "Thickness Measurements and Growth Kinetics of Thin SiO2 Layers", A.H. Carim and R. Sinclair, J. Electrochem. Soc., 137, pp. 279-283 (1990).
73. "Metastable Phase Formation in Thin Films and Multilayers", B.M. Clemens and R. Sinclair, MRS Bull., 15 (2), pp. 19-28 (1990).
74. "Deformation, Twinning and Thermo-Mechanical Strengthening of Ti50Ni47Fe3", W.J. Moberly, J.L. Proft, T.W. Duerig and R. Sinclair, Acta Metall., 38, pp. 2601-2612 (1990).
75. "A Thermodynamic Approach for Interpreting Metallization Layer Stability and Thin-Film Reactions Involving Four Elements: Application to Integrated Circuit Contact Metallurgy", A.S. Bhansali, R. Sinclair and A.E. Morgan, J. Appl. Phys., 68, pp. 1043-1049 (1990).
76. "Phase Reactions at Semiconductor Metallization Interfaces", A.S. Bhansali, D.H. Ko and R. Sinclair, J. Electron. Mater., 19, pp. 1171-1175 (1990).
77. "Study of Interfacial Reactions in Metal-Silicon and Related Interfacial Reactions by High Resolution Electron Microscopy and Thermodynamic Analysis", R. Sinclair, Mater. Trans. Jpn. Inst. Met., 31, pp. 628-635 (1990).
78. "SiO2/Si Interfaces Studied by STM and HRTEM (II)", M. Niwa, M. Onoda, M. Matsumoto, H. Iwasaki and R. Sinclair, Jpn. J. Appl. Phys., 29, pp. 2665-2670 (1990).
79. "Interface Microstructure of Titanium Thin-Film / Silicon-Crystal Single Substrate, Correlated with Electrical Barrier Heights", S. Ogawa, T. Yoshida, T. Kouzaki and R. Sinclair, J. Appl. Phys., 70, pp. 827-832 (1991).
80. "Structure of an Amorphous Ti-Si Alloy Formed by Thermal Reaction", K. Holloway, P. Moine, J. Delage and R. Sinclair, J. Non-Cryst. Solids, 134, pp. 133-140 (1991).
81. "Amorphous Phase Formation in an As-Deposited Platinum-GaAs Interface", D.H. Ko and R. Sinclair, Appl. Phys. Lett., 58, pp. 1851-1853 (1991).
82. "Metastable and Equilibrium Defect Structure of II/VI GaAs Interfaces", A.F. Schwartzman and R. Sinclair, J. Electron. Mater., 20, pp. 805-814 (1991).
83. "SiO2/Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy", M. Niwa, M. Onoda, M. Matsumoto, H. Iwasaki and R. Sinclair, J. Electrochem. Soc., 139, pp. 901-906 (1992).
84. "Modeling of Agglomeration in Polycrystalline Thin Films: Application to TiSi2 on a Silicon Substrate", T.P. Nolan, R. Sinclair and R. Beyers, J. Appl. Phys., 71, pp. 720-724, (1992).
85. "Structural Determination of Amorphous Ni-Ti Thin Films, Using Electron Diffraction Analysis", P. Moine, J. Delage, A.R. Pelton and R. Sinclair, Acta Metall., 40, pp. 1855-1863 (1992).
86. "Amorphous Phase Formation and Initial Interfacial Reaction in the Pt/GaAs System", D.H. Ko and R. Sinclair, J. Appl. Phys., 72, pp. 2036-2042 (1992).
87. "Epitaxial Pt (001), Pt (110) and Pt (111) Films on MgO (001), MgO (110), MgO (111) and Al2O3 (0001)", B.M. Lairson, M.R. Visokay, R. Sinclair, S. Hagstrom and B.M. Clemens, Appl. Phys. Lett., 61, pp. 1390-1392 (1992).
88. "Microstructure and Crystallography of Textured CoCrTa/Cr Sputtered Thin Film Media for Longitudinal Recording", T.P. Nolan, R. Sinclair, R. Ranjan and T. Yamashita, Ultramicroscopy, 47, pp. 437-446 (1992).
89. "Crystallization of Silicon in Aluminum/Amorphous-Silicon Multilayers", T.J. Konno and R. Sinclair, Philos. Mag. B, 66, pp. 749-765 (1992).
90. "Epitaxial PtFe (001) Thin Films on MgO (001) with Perpendicular Magnetic Anisotropy", B.M. Lairson, M.R. Visokay, R. Sinclair and B. M. Clemens, Appl. Phys. Lett., 62, pp. 639-641 (1993).
91. "TEM Analysis of Co-Gd and Cr-Gd Multilayer Structures", G.A. Bertero, T.C. Hufnagel, B.M. Clemens and R. Sinclair, J. Mater. Res., 8, pp. 771-774 (1993).
92. "Transmission Electron Microscopic Analysis of Microstructural Features in Magnetic Recording Media", T.P. Nolan, R. Sinclair, R. Ranjan and T. Yamashita, IEEE Trans. Magn., 29, pp. 292-299 (1993).
93. "Direct Observation of Crystallization in Silicon by In Situ High Resolution Electron Microscopy", R. Sinclair, J. Morgiel, A.S. Kirtikar, I.W. Wu and A. Chiang, Ultramicroscopy, 51, pp. 41-45 (1993).
94. "Crystallographic Orientation of Textured CoCrTa/Cr Recording Media", T.P. Nolan, R. Sinclair, R. Ranjan and T. Yamashita, J. Appl. Phys., 73, pp. 5117-5124 (1993).
95. "Effect of Microstructural Features on Media Noise in Longitudinal Recording Media", T.P. Nolan, R. Sinclair, R. Ranjan and T. Yamashita, J. Appl. Phys., 73, pp. 5566-5568 (1993).
96. "Microstructural Analysis of Magnetic Fe/Pt Multilayer Thin Films by Transmission Electron Microscopy", M. R. Visokay, B.M. Lairson, B.M. Clemens and R. Sinclair, J. Magn. Magn. Mater., 126, pp. 136-140 (1993).
97. "Influence of Interfacial Doping with Rare Earth Elements on the Magnetic Properties of Selected Co/Pt Multilayers", G.A. Bertero and R. Sinclair, J. Magn. Mag. Mater., 126, pp. 275-278 (1993).
98. "Annealing of Metal Multilayers Studied by In Situ High Resolution Electron Microscopy", R. Sinclair and T.J. Konno, J. Magn. Magn. Mater., 126, pp. 108-112 (1993).
99. "Crystallization and Decomposition of Co-sputtered Amorphous Silicon-Aluminum Thin Films", T.J. Konno and R. Sinclair, Mater. Chem. Phys., 35, pp. 99-113 (1993).
100. "Epitaxial PtFe and PtCo(001) Thin Films with Perpendicular Magnetic Anisotropy", B.M. Lairson, M. R. Visokay, R. Sinclair and B.M. Clemens, J. Magn. Mag. Mater., 126, pp. 577-579 (1993).
101. "Epitaxial Tetragonal PtCo(001) Thin Films with Perpendicular Magnetic Anisotropy", B.M. Lairson, M.R. Visokay, E.E. Marinero, R. Sinclair and B.M. Clemens, J. Appl. Phys., 74, pp. 1922-1928 (1993).
102. "Annealing Effect on Structure of Fe/Zr Multilayers", K. Yamamoto, T. Nakayama, H. Sato, T.J. Konno and R. Sinclair, J. Magn. Magn. Mater., 126, pp. 128-130 (1993).
103. "Structure and Corrosion Properties of Al/Si Multilayers", T. Nakayama, T.J. Konno, H. Satoh and R. Sinclair, J. Magn. Magn. Mater., 126, pp. 167-169 (1993).
104. "Structure and Corrosion Properties of Fe/Zr Multilayers", T. Nakayama, H. Sato, T. J. Konno, B.M. Clemens, D.A. Stevenson, R. Sinclair and S.B. Hagstrom, J. Magn. Mag. Mater., 126, pp. 105-107 (1993).
105. "Atomic-scale Planarization of SiO2/Si(001) Interfaces", M. Niwa, M. Udagawa, K. Okada, T. Kouzaki and R. Sinclair, Appl. Phys. Lett., 63, pp. 675-677 (1993).
106. "Crystallization of Co-sputtered Amorphous Cobalt-Carbon Alloys", T.J. Konno and R. Sinclair, Acta Metall. Mater., 42, pp. 1231-1247 (1994).
107. "Crystallization of Co-sputtered Amorphous Cobalt-Carbon Alloys: Morphology and Kinetics of Spherulitic Growth", T.J. Konno and R. Sinclair, Mater. Sci. Eng., A179/A180, pp. 297-302 (1994).
108. "Metal-Contact Induced Crystallization of Semiconductors," T.J. Konno and R. Sinclair, Mater. Sci. Eng. A, A179/A180, pp. 426-432 (1994).
109. "In-Situ , Dynamic High Resolution Transmission Electron Microscopy: Application to Pt/GaAs Interfacial Reactions", D.H. Ko and R. Sinclair, Ultramicroscopy, 54, pp. 166-178 (1994).
110. "Noise Properties and Microstructure of Oriented CoCrTa/Cr Media", R. Ranjan, W. R. Bennett, G.J. Tarnopolsky, T. Yamashita, T.P. Nolan and R. Sinclair, J. Appl. Phys., 75, pp. 6144-6146 (1994).
111. "Thermochemical Stability of BaFe12O19 and BaFe2O4 and Phase Relations in the Ba-Fe-O Ternary System". J. Li, T.M. Gur, R. Sinclair, S.S. Rosenblum and H. Hayashi, J. Mater. Res., 9, pp. 1499-1512 (1994).
112. "Structure-Property Correlations in Pt/Co Multilayers for Magneto-Optic Recording", G.A. Bertero and R. Sinclair, J. Magn. Magn. Mater., 134, pp. 173-184 (1994).
113. "Studies of Material Reactions by In-Situ High Resolution Electron Microscopy (HREM)," R. Sinclair, MRS Bull., 19 (6), pp. 26-31 (1994).
114. "Oxygen Coulometric Titration Study of M Ba-Ferrite", J. Li, T.M. Gur, R. Sinclair, S.S. Rosenblum and H. Hayashi, Solid State Ionics, 73, pp. 185-188 (1994).
115. "In Situ HREM: Application to Metal-Mediated Crystallization," R. Sinclair and T.J. Konno, Ultramicroscopy, 56, pp. 225-232 (1994).
116. "(Pt/Co/Pt)/X Multilayer Films With High Kerr Rotations and Large Perpendicular Magnetic Anisotropies", G.A. Bertero and R. Sinclair, Appl. Phys. Lett., 64, pp. 3337-3339 (1994).
117. "Temperature and Orientation Effects on Magnetic Properties of Barium Ferrite Thin Films", J. Li, R. Sinclair, S.S. Rosenblum and H. Hayashi, IEEE Trans. Magn., 30, pp. 4050-4052 (1994).
118. "Longitudinal Recording Performance of Doped Barium Ferrite Magnetic Thin Films", S. S. Rosenblum, J. Li, H. Hayashi and R. Sinclair, IEEE Trans. Magn., 30, pp. 4047-4049 (1994).
119. "Atomic-Order Planarization of Ultra-Thin SiO2/Si (001) Interfaces," M. Niwa, T. Kouzaki, K. Okada, M. Udagawa and R. Sinclair, Jpn. J. Appl. Phys., 33, pp. 388-394 (1994).
120. "Metal-Mediated Crystallization of Amorphous Silicon in Silicon-Silver Layered Systems," T.J. Konno and R. Sinclair, Philos. Mag. B, 71, pp. 163-178 (1995).
121. "Metal-Mediated Crystallization of Amorphous Germanium in Germanium-Silver Layered Systems," T.J. Konno and R. Sinclair, Philos. Mag. B, 71, pp. 179-199 (1995).
122. "Crystallization of Amorphous Carbon in Carbon-Cobalt Layered Thin Films," T. J. Konno and R. Sinclair, Acta Metall. Mater., 43, pp. 471-484 (1995).
123. "Direct Formation of Ordered CoPt and FePt Compound Thin Films by Sputtering", M.R. Visokay and R. Sinclair, Appl. Phys. Lett., 66, pp. 1692-1694 (1995).
124. "Interface Structure and Perpendicular Magnetic Anisotropy in Pt/Co Multilayers", G.A. Bertero, R. Sinclair, C.-H. Park and Z.X. Shen, J. Appl. Phys., 77, pp. 3953-3959 (1995).
125. "High Density Recording Characteristics of Sputtered Barium Ferrite Thin Films", J. Li, S.S. Rosenblum, W. Nojima, H. Hayashi and R. Sinclair, IEEE Trans. Magn., 31, pp. 2749-2751 (1995).
126. "As-deposited Crystalline Barium Ferrite Thin Film Media for Longitudinal Recording", J. Li, S.S. Rosenblum, H. Hayashi and R. Sinclair, J. Magn. Mag. Mater., 153, p. 246 (1995).
127. "Reaction Mediated Texturing of Barium Ferrite Magnetic Thin Films", J. Li, S. S. Rosenblum, H. Hayashi and R. Sinclair, J. Mater. Res., 10, pp. 2343-2349 (1995).
128. "Interfacial Reactions in the Zr/Si System Studied by In-Situ TEM", H. Tanaka, T.J. Konno, R. Sinclair and N. Hiroshita, J. Appl. Phys., 78, pp. 4982-4987 (1995).
129. "Kerr Rotations and Anisotropy in (Pt/Co/Pt)/X Multilayers", G.A. Bertero and R. Sinclair, IEEE Trans. Magn., 31, pp. 3337-3342 (1995).
130. "Magnetic and Structural Characteristics of Sputtered Barium Ferrite Thin Films" J. Li, S.S. Rosenblum, H. Hayashi and R. Sinclair, J. Magn. Magn. Mater., 155, pp. 157-160 (1995).
131. "Microstructural Evolution of NiFe/Ag Multilayers Studied by X-ray Diffraction and In Situ TEM", E. Snoeck, R. Sinclair, M.A. Parker, T.L. Hylton, K.R. Coffey, J.K. Howard, A. Lessmann and A.I. Bienenstock, J. Magn. Magn. Mater., 151, pp. 24-32 (1995).
132. "Anomalous Moment and Anisotropy Behavior in Fe3O4 Films", D.T. Margulies, F.T. Parker, F.E. Spada, J. Li, R. Sinclair, R.S. Goldman and A.E. Berkowitz, Phys. Rev. B, 53, p. 9175-9187 (1996).
133. "Micromagnetic and Experimental Studies of CoPtCr Polycrystalline Thin Film Media with Bicrystal Microstructure", Q. Peng, H.N. Bertram, N. Fussing, M.F. Doerner, M. Mirzamaani, D. Margulies, R. Sinclair and S. Lambert, IEEE Trans. Magn., 31, pp. 2821-2823 (1995).
134. "Structural Comparisons of Ion-Beam and RF Sputter-Deposited GMR Spin Valves by High Resolution Transmission Electron Microscopy", W.E. Bailey, N.C. Zhu, R. Sinclair and S.X. Wang, J. Appl. Phys., 79, pp. 6393-6395 (1996).
135. "Effects of Pt Addition on the Magnetic and Crystallographic Properties of Co-Cr-Pt Thin Film Media," A. Ishikawa and R. Sinclair, J. Magn. Magn. Mater., 152, pp. 265-273 (1996).
136. "Analyses of Stacking Fault Density in Co-Alloy Thin Films by High-Resolution Transmission Electron Microscopy," A. Ishikawa and R. Sinclair, IEEE Trans. Magn., 32, pp. 3605-3607 (1996).
137. "Measurements of Crystalline Anisotropy on Longitudinal Media," J.K. Chang, Q. Peng, H.N. Bertram and R. Sinclair, IEEE Trans. Magn., 32, pp. 4902-4904 (1996).
138. "Thin Film Media With and Without Bicrystal Cluster Structure on Glass Ceramic Structures," Q. Chen, J.K. Chang, G.L. Chen and R. Sinclair, IEEE Trans. Magn., 32, pp. 3599-3601 (1996).
139. "Microstructure-Magnetic Property Relationships in CoCrPt Magnetic Thin Films," S. McKinlay, N. Fussing, R. Sinclair, and M.F. Doerner, IEEE Trans. Magn., 32, pp. 3587-3589 (1996).
140. "Lorentz Transmission Electron Microscopy Study of Micromagnetic Structures in Real Computer Hard Disks," K. Tang, M. R. Visokay, R. Sinclair, C. Ross, R. Ranjan and T. Yamashita, IEEE Trans. Magn., 32, pp. 4130-4132 (1996).
141. "Growth of ?' Nitrogen-Martensite and Fe16N2 Films Using (001) Silicon Substrates," T.E. Clark, M. R. Visokay, N. Zhu, and R. Sinclair, IEEE Trans. Magn., 32, pp. 3503-3505 (1996).
142. "In Situ Observation of the C49-to-C54 Phase Transformation in TiSi2 Thin Films by Transmission Electron Microscopy", H. Tanaka, N. Hirashita and R. Sinclair, Jpn. J. Appl. Phys. Lett., 35, pp. L479-481 (1996).
143. "In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors", T.J. Konno and R. Sinclair, Materials Science Forum, 204-206, pp. 749-754 (1996).
144. "Evolution of Bicrystal Media," J.K. Chang, Q. Peng, Q. Chen, G.-L. Chen, H.N. Bertram and R. Sinclair, IEEE Trans. Magn., 33, pp. 885-890 (1997).
145. "Magnetic Clusters, Intergranular Exchange Interaction and Their Microstructural Basis in Thin Film Longitudinal Media", K. Tang, M.E. Schabes, C.A. Ross, L. He, R. Ranjan, T. Yamashita and R. Sinclair, IEEE Trans. Magn., 33, pp. 4074-4076 (1997).
146. "Wear Effects on the Microstructural Features of Amorphous Carbon Thin Film", A. Ramirez and R. Sinclair, Surf. Coat. Tech., 94-95, pp. 549-554 (1997).
147. "Nano-roughness Effect on Cr Growth Mechanism", J.K. Chang, Q. Chen, G.-L. Chen and R. Sinclair, J. Appl. Phys., 81 (8), pp. 3943-3946 (1997).
148. "Interfacial Reaction in the poly-Si/Ta2O5/TiN Capacitor System", H.-J. Lee, M.-B. Lee, H.-D. Lee and R. Sinclair, J. Appl. Phys., 82 (12), pp. 139-144 (1997).
149. "Evidence of Heteroepitaxial Growth of Copper on ?-Tantalum", K.W. Kwon, C. Ryu, R. Sinclair and S.S. Wong, Appl. Phys. Lett., 71, pp. 3069-3071 (1997).
150. "Chromium Segregation in CoCrTa/Cr and CoCrPt/Cr Thin Films for Longitudinal Recording Media", J.E. Wittig, T.P. Nolan, C.A. Ross, M.E. Schabes, K. Tang, R. Sinclair, and J. Bentley, IEEE Trans. Magn., 34, pp. 1564-1566 (1998).
151. "Effects of Ultra-High Vacuum on Crystallographic, Recording and Magnetic Properties of Thin Film Media", C. Gao, S. Wu, J.-P. Chen, R. Malmhall, C. Habermeier, R. Sinclair, H. Laidler and K. O'Grady, IEEE Trans. Magn., 34, pp. 1576-1578 (1998).
152. "Kinetic Analysis of the C49-to-C54 Phase Transformation in TiSi2 Thin Films by In Situ Observation", H. Tanaka, N. Hirashita and R. Sinclair, Jpn. J. Appl. Phys., 37, pp. 4284-4287 (1998).
153. "Crystallization of Amorphous Carbon Thin Films in the Presence of Magnetic Media", A. G. Ramirez, T. Itoh and R. Sinclair, J. Appl. Phys., 85, pp. 1508-1513 (1999).
154. "A Study of the Failure Mechanism of a Titanium Nitride Diffusion Barrier", H.-J. Lee, P. Li, B. Roberts and R. Sinclair, J. Appl. Phys., 86 (6), pp. 3096-3103 (1999).
155. "Solid-state Amorphization at tetragonal-Ta/Cu Interfaces", K.-W. Kwon, H.-J. Lee and R. Sinclair, Appl. Phys. Lett., 75 (7), pp. 935-937, (1999).
156. "Wear-induced Modifications of Amorphous Carbon in the Presence of Magnetic Media", A. G. Ramirez and R. Sinclair, J. Appl. Phys., 85 (8), pp. 5597-5599, (1999).
157. "Thermal Stability of a Cu/Ta Multilayer: an Intriguing Interfacial Reaction", H.-J. Lee, K. W. Kwon, C. Ryu and R. Sinclair, Acta Mater., 47 (15/16), pp. 3965-3975, (1999).
158. "Growth and Characterization of Epitaxial NiMnSb/PtMnSb C1b Heusler Alloy Superlattices", F. B. Mancoff, J. F. Bobo, O. Richter, K. Bessho, P. R. Johnson, R. Sinclair, W. D. Nix, R. L. White and B. M. Clemens, J. Mater. Res., 14 (4), pp. 1560-1569, (1999).
159. "Case Study of Media Noise Mechanisms in Longitudinal Recording", E. T. Yen, S.Z. Wu, T. Thomson, R. Ristau, R. Ranjan, G. C. Rauch, C. Habermeier and R. Sinclair, IEEE Trans. Magn., 35 (5), pp. 2730-2732, (1999).
160. "Study of DC Plasma Oxidized Al2O3 Barriers in Spin Dependent Tunneling Junctions Using High Resolution Transmission Electron Microscopy", T. E. Clark, F. B. Mancoff, S. X. Wang, B.M. Clemens and R. Sinclair, IEEE Trans. Magn., 35 (5), pp. 2922-2924, (1999).
161. "Grain Size Analysis of Longitudinal Thin Film Media", D.W. Park, R. Sinclair, B.B. Lal, S.S. Malhotra and M.A. Russak, J. Appl. Phys., 87 (9), pp. 5687-5689, (2000).
162. "In Situ TEM Studies of Metal-Carbon Reactions", R. Sinclair, T. Itoh and R. Chin, Microscopy and Microanalysis 8, pp. 288-304, (2002).
163. "Transmission Electron Microscopy Analysis of Computer Hard Disc, Magnetic Thin Films", J. Risner, U. Kwon, D.W. Park and R. Sinclair, Mater. Chem. Phys. 81, pp. 241-243, (2003)
164. "Thermal Stability of Epitaxial Pt Films on Y2O3 in a Metal-Oxide-Si Structure", M.-H. Cho, D.W. Moon, K.H. Min, R. Sinclair, S.A. Park, Y.K. Kim, K. Jeong, S.K. Kang and D.-H. Ko, Appl. Phys. Lett., 83 (23), pp. 4758-4760, (2003).
165. "Change in the Chemical State and Thermal Stability of HfO2 by the Incorporation of Al2O3", M.-H. Cho, H.S. Chang, Y.J. Cho, D.W. Moon, K.-H. Min, R. Sinclair, S.K. Kang, D.-H. Ko, J.H. Lee, J.H. Gu and N.I. Lee, Appl. Phys. Lett., 84 (4), pp. 571-573, (2004).
166. "Carbide Evolution in Temper Embrittled NiCrMoV Bainitic Steel", J.E. Wittig and R. Sinclair, Steel Res. Int., 75 (1), pp. 47-54, (2004).
167. "Investigation of the Chemical State of Ultrathin Hf-Al-O Films during High Temperature Annealing", M.-H. Cho, H. S. Chang, Y.J. Cho, D.W. Moon, K.-H. Min, R. Sinclair, S.K. Kang, D.-H. Ko, J.H. Lee, J.H. Gu, et al., Surface Science, 554 (1), pp. L75-
L80, (2004). 168. "Recent Developments in Nano-Characterization of Materials", R. Sinclair, H. Li, J. Risner, U. Kwon, J.U. Huh, R.W. Chin and K.H. Min, J. Ceram. Proc. Res., 5 (1), pp. 5-9 (2004).
169. "Crystallization and Anisotropic Dielectric Properties of Tantalum Oxide Thin Films", K.-H. Min and R. Sinclair, J. Ceram. Proc. Res., 6, pp. 17-19, (2005).
170. "Application of In Situ HREM to Study Crystallization in Materials", R. Sinclair, K.-H. Min, and U. Kwon, Materials Science Forum, 494, pp. 7-12, (2005).
171. "Crystallization Behavior of ALD-Ta2O5 Thin Films: An Application of In-situ TEM", K.-H. Min, R. Sinclair, I.-S. Park, S.-T. Kim, and U.-I. Chung, Philos. Mag., 85 (18), pp. 2049-2063, (2005).
172. "Ru/Ru-oxide Interlayers for CoCrPtO Perpendicular Recording Media", U. Kwon, R. Sinclair, E.M.T. Velu, S. Malhotra, and G. Bertero, IEEE Trans. Magn., 41 (10), pp. 3193-3195, (2005).
173. "Observation of the Effect of Grain Orientation on Chromium Segregation in Longitudinal Magnetic Media", J.D. Risner, R. Sinclair and J. Bentley, J. Appl. Phys., 99, pp. 033905-1-7, (2006).
174. "FIB and TEM Studies of Interface Structure in Diamond-SiC Composites," J.S. Park, R. Sinclair, D. Rowcliffe, M. Stern, and H. Davidson, J. Mater. Sci., 41 (14), pp. 4611-4616, (2006).
175. "Effect of Magnetic Recording Layer Thickness on Media Performance in CoCrPt-Oxide Perpendicular Media," U. Kwon, H.S. Jung, M. Kuo, E.M.T. Velu, S.S. Malhotra, W. Jiang, G. Bertero, and R. Sinclair, IEEE Trans. Magn., 42 (10), pp. 2330-2332, (2006).
176. "Microstructure and Exchange Coupling of Segregated Oxide Perpendicular Recording Media", T.P. Nolan, J.D. Risner, S.D. Harkness, E. Girt, S.Z. Wu, G.P. Ju and R. Sinclair, IEEE Trans. Magn., 43 (2), pp. 639-644, (2007).
177. "Orientation Relationship in Diamond and Silicon Carbide Composites", J.S. Park, R. Sinclair, D. Rowcliffe, M. Stern and H. Davidson, Diamond Rel. Mater., 16 (3), pp. 562-565, (2007).
178. "Analytical TEM Examinations of CoPt-TiO2 Perpendicular Magnetic Recording Media", J.D. Risner, T.P. Nolan, J. Bentley, E. Girt, S.D. Harkness IV, and R. Sinclair, Microsc. Microanal., 13, pp. 70-79, (2007).
179. "High-Moment Antiferromagnetic Nanoparticles with Tunable Magnetic Properties", W. Hu, R. J. Wilson, A.L. Koh, A. Fu, A.Z. Faranesh,C. M. Earhart, S.J. Osterfeld, S-J. Han, L. Xu, S. Guccione, R. Sinclair and Shan X. Wang, Advanced Materials 20, pp. 1479-1483 (2008).
180. "Real-Time Intravital Imaging of RGD-Quantum Dot Binding to Luminal Endothelium in Mouse Tumor Neovasculature", B. R. Smith, Z. Cheng, A. De, A. L. Koh, R. Sinclair and S. S. Gambhir, Nano Letters 8(9), pp. 2599-2606, (2008).
181. "Synthesis and characterization of PVP-coated large core iron oxide nanoparticles as an MRI contrast agent", H-Y. Lee, S-H Lee, C. Xu, J. Xie, J-H. Lee, B. Wu, A. L. Koh, X. Wang, R. Sinclair, S. X. Wang, D. G. Nishimura, S. Biswal1, S. Sun, S. H. Cho and X. Chen, Nanotechnology 19 (2008) 165101
182. "TEM Analyses of Synthetic Anti-Ferromagnetic (SAF) Nanoparticles Fabricated Using Different Release Layers", A.L. Koh, W. Hu, R.J. Wilson, S.X. Wang and R. Sinclair, Ultramicroscopy 108, pp. 1490-1494 (2008).
183. "Improved QD-BRET Conjugates for Detection and Imaging", Y. Xing, M-K. So, A.L. Koh, R. Sinclair and J. Rao, Biochemical and Biophysical Research Communications 372, pp. 388-394 (2008).
184. "Electron Microscopy Localization and Characterization of Functionalized Composite Organic-Inorganic SERS Nanoparticles on Leukemia Cells", A. L. Koh, C.M. Shachaf, S. Elchuri, G.P. Nolan and R. Sinclair, Ultramicroscopy 109, pp. 111-121 (2008)
185. "Preparation, Structural and Magnetic Characterization of Synthetic Anti-ferromagnetic (SAF) Nanoparticles", A.L. Koh, W. Hu, R.J. Wilson, S.X. Wang and R. Sinclair, Philosophical Magazine 88:36 pp. 4225-4241 (2008).
186. "Multiplex detection of protease activity with quantum dot nanosensors prepared by intein-mediated specific bioconjugation", Z. Xia, Y. Xing, M-K. So, A.L. Koh, R. Sinclair and J. Rao, Anal. Chem. 80, pp. 8649-8655 (2008).
187. "Particle Size, Surface Coating, and PEGylation Influence the Biodistribution of Quantum Dots in Living Mice", M.L. Schipper, G. Iyer, A.L. Koh, Z. Cheng, Y. Ebenstein, A. Aharoni, S. Keren, L.A. Bentolila, J. Li, J. Rao, X. Chen, U. Banin, A.M. Wu, R. Sinclair, S. Weiss, and S.S. Gambhir, Small 5 (1) (2009): 126-34.
188. "Synthetic Antiferromagnetic Nanoparticles with Tunable Susceptibilities", W. Hu, R. J. Wilson, C. M. Earhart, A.L. Koh, R. Sinclair and S. X. Wang, J. Appl. Phys. 105, 2009, pp. 07B508 1-3.
189. "Formation and properties of magnetic chains for 100 nm nanoparticles used in separations of molecules and cells ", R.J. Wilson, W. Hu, C. P.F. Wong, A.L. Koh, R. Gaster, C.M. Earhart, A. Fu, S.C. Heilshorn, R. Sinclair and S. X. Wang, J. Magn. Magn. Mat. 321 (2009), pp.1452-1458.
190. "'No Titan, No Excuse' (T.J. Konno, 1 April 2008) A Report on an International Workshop on Remote Electron Microscopy for In Situ Studies", R. Sinclair, R. Chin, A.L. Koh and G. Solorzano, Acta Microscopica 18(1) (2009) pp. 33-38.
191. "A novel method for detection of phosphorylation in single cells by Surface Enhanced Raman Scattering (SERS) using Composite Organic-Inorganic Nanoparticles (COINs)", C. M. Shachaf, S. Elchuri, A.L. Koh, J. Zhu, L. Nguyen, D.J. Mitchell, J. Zhang, K. Swartz, L. Sun, S. Chan, R. Sinclair and G.P. Nolan, PLoS One 4(4) (2009) doi:10.1371/journal.pone.0005206
192. "Structural and Magnetic Characterization of High Moment Synthetic Antiferromagnetic Nanoparticles Fabricated Using Self-Assembled Stamps", A.L. Koh, W. Hu, R.J. Wilson, C. M. Earhart, S. X. Wang and R. Sinclair, , J. Appl Phys. 107 (2010), pp. 09B522 1-3.
193. "Atomic layer deposition of ZnS via in situ production of H2S", J.R. Bakke, J.S. King, H.J. Jung, R. Sinclair, S.F. Bent, THIN SOLID FILMS. 518 (2010) pp. 5400-5408
194. "Atomic Layer Deposition of CdS Films", J. R. Bakke, H. J. Jung, J. T. Tanskanen, R. Sinclair, and S. F. Bent, Chem. Mater. 22 (2010), pp. 4669-4678
195. "Atomic Layer Deposition of CdxZn1-xS Films", J. R. Bakke, J. T. Tanskanen , H. J. Jung, R. Sinclair and Stacey F. Bent, Journal of Materials Chemistry, accepted (2010).
196. "Scanning Tunneling Spectroscopy of Lead Sulfide Quantum Wells Fabricated by Atomic Layer Deposition for Band Gap Engineering", W. Lee, N. P. Dasgupta, H. J. Jung, J-R. Lee, R. Sinclair and F. B. Prinz, Nanotechnology, accepted (2010)
197. "Atomic Layer Deposition of Lead Sulfide Quantum Dots on Nanowire Surfaces", H. J. Jung, N. Dasgupta, O. Trejo, M. T. McDowell, A. Hryciw, M. Brongersma, R. Sinclair and F. B. Prinz, Nano Lett,. submitted (2010).
198. "Laser-Synthesized Epitaxial Graphene", S. Lee, M.l F. Toney, W. Ko, J. C. Randel, H. J. Jung, K. Munakata, J. Lu, T. H. Geballe, M. R. Beasley, R. Sinclair, H. C. Manoharan and A. Salleo, Nano Lett,. submitted (2010).
199. "3-D Crater Patterned Protonic Fuel Cell with Ultra Thin Y:BaZrO3 Ceramic Membrane", Y.B. Kim, T.M. Gur, S. Kang, H.J. Jung, R. Sinclair and F.B. Prinz, Nano Lett., submitted (2010).
200. "Effect of crystallinity on ionic conductivity of Y-doped Barium Zirconate", Y.B. Kim, T.M. Gur, H.J. Jung, S. Kang, R. Sinclair and F.B. Prinz, Chem. Mater, submitted (2010).
201. " Oxidative Stress Mediates teh Effets of Raman Active Gold Nanoparticles in Human Cells"A.S. Thakor, R. Raulmurugan, P.J. Kempen, C.L. Zavaleta, R, Sinclair, T.F. Massoud, and S.S. Gambhir, Small, submitted (2010).
202. The Fate and Toxicity of Raman Active Silica-Gold Nanoparticles in Mice", A.S. Thakor, R. Luong, R. RaulMurugan, Fi. Lin, P.J. Kempen, C.L. Zavaleta, P. Chu, T.F. Massoud, R. Sinclair, and S.S. Gambhir, " Nature Nano, submitted (2010).

C. PATENTS


1. "Multilayered Thin Films for Perpendicular Magnetic Recording", G. A. Bertero and R. Sinclair, filed April 1994.
2. "Method for Producing Uniaxial Tetragonal Thin Films of Ternary Intermetallic Compounds", M. R. Visokay, B. M. Lairson and R. Sinclair, filed February 1995.

D. CONFERENCE ARTICLES, ETC.(non-refereed and refereed)


1. "High Resolution Transmission Electron Microscopy", R. Sinclair, Industrial Research, pp. 62-65 (October 1973).
2. "Lattice Image Contrast of Ordered Domains in Cu3Au", R. Sinclair and G. Thomas, 32nd Proc. EMSA, pp. 500-501 (1974).
3. "A New 10000C Double Tilt Stage for the Hitachi 650 kV Microscope", W. Worthington, T. Kosel and R. Sinclair, 32nd Proc. EMSA, pp. 442-443 (1974).
4. "Lattice Imaging of Ordered Alloys", R. Sinclair, K. Scheider and G. Thomas, Proc. ICEM-VIII, pp. 520-521 (1974).
5. "Lattice Image Studies of Ordered Alloys", R. Sinclair and J. Dutkiewicz, 33rd Proc. EMSA, pp. 10-11 (1975).
6. "Lattice Imaging of Spinodal Alloys", R. Gronsky, M. Okada, R. Sinclair and G. Thomas, 33rd Proc. EMSA, pp. 22-23 (1975).
7. "Studies of Atomic Scattering Factors from the Critical Voltage in Ordered Alloys: Applications to Cu3Au", A. Rocher, R. Sinclair and G. Thomas, Proc. 4th Int'l Congress on High Voltage Electron Microscopy, pp. 125-128 (1975).
8. "Preliminary Observations of Electron Irradiation Damage in Short-Range Ordered Ni4Mo", R. Sinclair, D.S. Gelles and G. Thomas, 34th Proc. EMSA, pp. 600- 601 (1976).
9. "Optical Microdiffraction in Lattice Image Analysis", R. Gronsky, R. Sinclair, and G. Thomas, 34th Proc. EMSA, pp. 494-495 (1976).
10. "Lattice Image and Optical Diffraction Studies of Alloys", G. Thomas, R. Sinclair, and R. Gronsky, Proc. 6th European Congress on Electron Microscopy, Jerusalem, pp. 114-119 (1976).
11. "Applications of High Resolution Electron Microscopy in Materials Science", Report of Workshop on High Resolution Electron Microscopy, eds. G. Thomas, R.M. Glaeser, J.M. Cowley and R. Sinclair, Lawrence Berkeley Laboratory Special Publication #106, pp. 71-79 (1976).
12. "Fine Structure of Interfaces as Revealed by Lattice Fringe Imaging", R. Sinclair, 35th Proc. EMSA, pp. 110-113 (1977).
13. "Aspects of Microanalysis in a TEM", R. Sinclair and B.E. Jacobson, Proc. ICEM-IX 1, pp. 510-511 (1978).
14. "Applications of Lattice Fringe Imaging", R. Sinclair, Proc. ICEM-IX 3, pp. 140-146 (1978).
15. "Growth Relationships in Nb3Sn-Cu Superconducting Composites", B.E. Jacobson and R. Sinclair, New Developments and Applications in Composites, eds. D. Kuhlman-Wilsdorf and W.C. Harrigan (Met. Soc., AIME), pp. 204-221 (1979).
16. "In-Situ Observations of Diffusionless Transformations in NiTi", G.M. Michal and R. Sinclair, ICOMAT 79, pp. 136-141 (1979).
17. "Origin of Stacking Faults in NiTi Martensite", R. Sinclair, Modulated Structures 1979, eds. J.M. Cowley, J.B. Cohen, M.B. Salamon and B.J. Wuensch, AIP Proc. #53, pp. 269-271 (1979).
18. "Lattice Fringe Imaging of Alloys", R. Sinclair, 37th Proc. EMSA, pp. 404-407 (1979).
19. "Physical Properties of Ion-Implanted SEM-Annealed Silicon", J.L. Regolini, N.M. Johnson, R. Sinclair, T.W. Sigmon and J.F. Gibbons, Laser and Electron Beam Processing of Materials, eds. C.W. White and P.S. Percey, Academic (New York), pp. 297-302 (1980).
20. "High Resolution Imaging of Cadmium Telluride", R. Sinclair, F. Ponce, T. Yamashita and P. Pirouz, Proc. 7th European Congress on Electron Microscopy, pp. 312-313 (1980).
21. "Structure Imaging of Defects in Cadmium Telluride", F. Ponce, T. Yamashita and R. Sinclair, 38th Proc. EMSA, pp. 320-321 (1980).
22. "A Transmission Electron Microscopical Investigation of Phase Transformations in TiNi", P. Moine, G.M. Michal and R. Sinclair, 38th Proc. EMSA, pp. 340-341. (1980).
23. "Defect Structure of Deformed WC", M.K. Hibbs and R. Sinclair, 38th Proc. EMSA, pp. 216-217 (1980).
24. "Analytical Electron Microscopy of Ferroelectric BaTiO3", M.L. Mecartney and R. Sinclair, 38th Proc. EMSA, pp. 364-365 (1980).
25. "Combined High Resolution and Analytical TEM Studies of Phase-Separated Alloys", C.K. Wu, A.F. Marshall, G. Thomas and R. Sinclair, 38th Proc. EMSA, pp. 176-177 (1980).
26. "Chemical and Microstructural Analyses of Grain Boundaries in BaTiO3-Based Dielectrics". M.L. Mecartney, R. Sinclair and G.J. Ewell, Advances in Ceramics, Volume 1, edited by L.M. Levinson, (American Ceramic Soc. Columbus, OH) pp. 207-214 (1981).
27. "Imaging of Defects in Cadmium Telluride Using High Resolution Transmission Electron Microscopy", F.A. Ponce, T. Yamashita, R.H. Bube and R. Sinclair, in Defects in Semiconductors, eds. J. Narayan and T.Y. Tan, (1981).
28. "High Resolution Transmission Electron Microscopy of Semiconductor Materials", R. Sinclair, F.A. Ponce, J.C. Bravman, T. Yamashita and P. Pirouz, Proc. of the 2nd Conference on Microscopy of Semiconducting Materials, Oxford, England, pp. 147-152 (1981).
29. "High Resolution Imaging of Semiconductor Interfaces", R. Sinclair, F.A. Ponce, T. Yamashita and J.C. Bravman, 39th Proc. EMSA, pp. 124-127 (1981).
30. "The Premartensitic State in TiNi", R. Sinclair, P. Moine and G.M. Michal, Proc. of the Int'l Conference on Solid-Solid Phase Transformations, pp. 1253-1257 (1981).
31. "Applications of the 2 1/2 D TEM Technique", R. Sinclair, EMAG1981, Inst. Phys. Conference Series 61, pp. 341-342 (1982).
32. "Lattice Resolution Movie of Defect Modification in Cadmium Telluride", R. Sinclair, D.J. Smith, S.J. Erasmus and F.A. Ponce, Proc. ICEM-X 2, pp. 47-48 (1982).
33. "The Effect of Oxygen in Cosputtered (Titanium + Silicon) Films", R. Beyers, R. Sinclair and M.E. Thomas, in Defects in Semiconductors, eds. J.W. Corbett and S. Mahajan, (Elsevier North-Holland), pp. 423-427 (1982).
34. "Dynamic Observation of Atomic-Level Events in Cadmium Telluride by High Resolution TEM", T. Yamashita and R. Sinclair, in Defects in Semiconductors, eds. J.W. Corbett and S. Mahajan, (Elsevier North-Holland), pp. 295-299 (1982).
35. "High Resolution Electron Microscopy II-VI Compound Semiconductors", R. Sinclair, F.A. Ponce, T. Yamashita and David J. Smith, Inst. Phys. Conference Series 67, pp. 103-108 (1983).
36. "Defect Structure of WC Deformed at Room and High Temperatures", M.K. Hibbs, D.J. Rowcliffe and R. Sinclair, Proc. of the Int'l Conference on the Science of Hard Materials, eds. R.K. Viswanathan, D.J. Rowcliffe and J. Gurland, pp. 121-135 (1983).
37. "Microstructural Characterization of Deformation and Precipitation in (W, Ti)C", S.L. Shinde, V. Jayaram and R. Sinclair, Proc. of the Int'l Conference on the Science of Hard Materials, eds. R.K. Viswanathan, D.J. Rowcliffe and J. Gurland, pp. 137-154 (1983).
38. "High Voltage High Resolution Electron Microscopy of Compound Semiconductors", R. Sinclair, F.A. Ponce, T. Yamashita and David J. Smith, Proc. 7th Int'l Conference on High Voltage Electron Microscopy, LBL Report #16031, pp. 31-34 (1983).
39. "HREM of Interfaces and Defects in Semiconductors", R. Sinclair, 41st Proc. EMSA, pp. 130-133 (1983).
40. "Lattice Imaging of CdS/CdTe Solar Cell Interface", T. Yamashita, J.G. Werthen, R.H. Bube and R. Sinclair, 41st Proc. EMSA, ed. G.W. Bailey, San Francisco Press, San Francisco, pp. 124-125 (1983).
41. "Observation of Dislocation Reactions in CdTe at Lattice Resolution", T. Yamashita and R. Sinclair, 41st Proc. EMSA, pp. 112-113 (1983).
42. "Structural Determination of Amorphous Ti-Ni Alloys" A.R. Pelton, P. Moine, and R. Sinclair, 42nd Proc. EMSA, pp. 508-509 (1984).
43. "The Morphology of the Polysilicon-SiO2 Interface", J.C. Bravman and R. Sinclair, Mat. Res. Soc. Symp. Proc., 25, pp. 311-316 (1984).
44. "Silicon on Sapphire of Single Crystal Quality Obtained by Double Solid Phase Expitaxial Regrowth", M.A. Parker, T.W. Sigmon and R. Sinclair, Mat. Res. Soc. Symp. Proc., 37, pp. 211-216 (1985).
45. "Morphological Studies of Polysilicon Emitter Contacts", J.C. Bravman, G.L. Patton, R. Sinclair and J.D. Plummer, Mat. Res. Soc. Symp. Proc., 37, pp. 461-466 (1985).
46. "Characterization of Emitter-Collector Shorts by Anodization, Voltage Contrast SEM and TEM", A.H. Carim, R. Sinclair and W.T. Stacy, Mat. Res. Soc. Symp. Proc., 41, pp. 375-380 (1985).
47. "Direct Observation of Defect Motion in Silicon By High Resolution Transmission Electron Microscopy", M.A. Parker and R. Sinclair, 43rd Proc. EMSA, pp. 358-359 (1985).
48. "In-Situ High Resolution Transmission Electron Microscopy of Dynamic Events During the Amorphous to Crystalline Phase Transformation in Silicon", M.A. Parker, T.W. Sigmon and R. Sinclair, Mat. Res. Soc. Symp. Proc., 62, pp. 311-321 (1985).
49. "The Evolution of Si/SiO2 Interface Roughness", A.H. Carim and R. Sinclair, in Semiconductor Silicon 1986, eds. H.R. Huff, T. Abe, and B. Kolbesen, The Electrochemical Soc. Inc., Pennington, NJ, pp. 458-469 (1986).
50. "In Situ HREM and HVEM Studies of Silicon Epitaxial Regrowth", M.A. Parker and R. Sinclair, Proc. ICEM-XI 2, pp. 991-992 (1986).
51. "Crystalline-To-Amorphous Transitions in Ti-Ni Alloys", A.R. Pelton, P. Moine, M.A. Noak and R. Sinclair, Mat. Res. Soc. Symp. Proc., 62, pp. 291-302 (1986).
52. "Interfacial Reactions in Titanium-Silicon Multilayers", K. Holloway and R. Sinclair, Mat. Res. Soc. Symp. Proc., 77, pp. 357-362 (1987).
53. "In Situ High Resolution Electron Microscopy for Interface Studies", M.A. Parker and R. Sinclair, Mat. Res. Soc. Symp. Proc., 82, pp. 379-382 (1987).
54. "In-Situ and High-Resolution TEM Observation of Interfacial Reactions in Metal- Silicon Multilayers", K. Holloway, K.B. Do and R. Sinclair, Mat. Res. Soc. Symp. Proc., 103, pp. 167-172 (1988).
55. "Microstructures of Polysilicon", R. Sinclair, A.H. Carim, J. Morgiel and J.C. Bravman, Mat. Res. Soc. Symp. Proc., 106, pp. 27-38 (1988).
56. "Compressive Deformation and Fracture in WC Materials", D.J. Rowcliffe, V. Jayaram, M.K. Hibbs and R. Sinclair, Mat. Sci. and Eng. A, 105-106, pp. 299-303 (1988).
57. "Phase Equilibria at Semiconductor Interfaces", R. Sinclair, A.S. Bhansali and A.F. Schwartzman, Proc. 2nd Advanced Materials Institute Conf., pp. 11-17, ed. by F. W. Smith (AMI) (1989).
58. "In Situ High Resolution Electron Microscopy", R. Sinclair, 47th Proc. EMSA, pp. 448-449 (1989).
59. "Reactions at Metal-Semiconductor Interfaces", R. Sinclair, 47th Proc. EMSA, pp. 638-639 (1989).
60. "Transmission Electron Microscopy and High Resolution Scanning Electron Microscopy of Co-Ni-Pt Thin Film Magnetic Recording Media", L. Chan, T. Yamashita and R. Sinclair, 47th Proc. EMSA, pp. 570-571 (1989).
61. "HREM In Situ Annealing of the CdTe/GaAs Heterojunction", A.F. Schwartzman and R. Sinclair, Mat. Res. Soc. Symp. Proc., 139, pp. 205-210 (1989).
62. "Reaction and Structure at Metal-Semiconductor Interfaces", R. Sinclair, K. Holloway, K.B. Kim, D.H. Ko, A.S. Bhansali, A.F. Schwartzman and S. Ogawa, Inst. Phys. Conference Series 100, pp. 599-607 (1989).
63. "In Situ Annealing Transmission Electron Microscopy (TEM) Study of Ti/GaAs and Ni/GaAs Interfacial Reactions", K.B. Kim and R. Sinclair, Mat. Res. Soc. Symp. Proc., 148, pp. 21-26 (1989).
64. "Quaternary Phase Equilibria in the Ti-Si-N-O System: Stability of Metallization Layers and Prediction of Thin Film Reactions", A.S. Bhansali and R. Sinclair, Mat. Res. Soc. Symp. Proc., 148, pp. 71-76 (1989).
65. "High-Resolution TEM of Metal-Semiconductor Interfaces", R. Sinclair, Proc. 2nd Int'l Conf. Solid St. Int. Circ. Techn., in press (1989).
66. "In Situ HREM Observation of Crystallization in Amorphous Silicon", J. Morgiel, I.W. Wu, A. Chiang and R. Sinclair, Proc. 2nd Int'l Conf. Solid St. Int. Circ. Techn., in press (1989).
67. "Twinless Martensite in TiNiCu Shape Memory Alloys", W.J. Moberly, T.W. Duerig, J.L. Proft and R. Sinclair, Proc. ICOMAT-89, pp. 605 (1989).
68. "Structure and Reaction at Metal-Semiconductor Interfaces", R. Sinclair and S. Ogawa, Jpn. Soc. Appl. Phys., Catalog No. AP892228, No. 431, pp. 29-33 (1989).
69. "Mechanical Twinning and Plasticity in Ti-Ni-Fe(3%)", W.J. Moberly, T.W. Duerig, J.L. Proft and R. Sinclair, Proc. ICOMAT-89, edited by B.C. Muddle, Trans Tech. Publications Ltd., pp. 759 (1990).
70. "Twinning in Ternary Ti50Ni(50-x)Mx Alloys", W.J. Moberly, R. Sinclair and T.W. Duerig, Proc. ICEM-XII 4, pp. 186-187 (1990).
71. "In Situ High-Resolution Electron Microscopy", R. Sinclair, Proc. ICEM-XII 4, pp. 512-513 (1990).
72. "A Phase Diagram Approach for Predicting Reactions in Al/TiW (-Nitride) Thin-Film Systems", A.S. Bhansali, I.J.M.M. Raaijmakers, R. Sinclair. A.E. Morgan, B.J. Burrow and M. Arst, Mat. Res. Soc. Symp. Proc., 187, pp. 15-20 (1990).
73. "Microstructure-Property Studies for Semiconductor Interfaces Using High- Resolution Electron Microscopy", R. Sinclair, SPIE Conf. Proc., edited by H.G. Craighead and J.M. Gibson, 1284, pp. 225-227 (1990).
74. "Characterization of Metal Silicide/Silicon Interfaces", R. Sinclair, Proc. Semicon/Kansai, pp. 95-101 (1990).
75. "Thermodynamic Stability of PtAl Thin Films on GaAs", D.H. Ko and R. Sinclair, Mat. Res. Soc. Symp. Proc., 181, pp. 333-338 (1990).
76. "Structure of the Ti-Single Crystal Si Interface", S. Ogawa, T. Kouzaki, T. Yoshida and R. Sinclair, Mat. Res. Soc. Symp. Proc., 181, pp. 139-144 (1990).
77. "SiO2/Si Interfaces Studied by STM and HRTEM", M. Niwa, M. Onoda, H. Iwasaki and R. Sinclair, Mat. Res. Soc. Symp. Proc., 183, pp. 141-146 (1990).
78. "In Situ HREM Observations of Crystallization in LPCVD Amorphous Silicon", J. Morgiel, I.W. Wu, A. Chiang and R. Sinclair, Mat. Res. Soc. Symp. Proc., 182, pp. 191-194 (1990).
79. "HRTEM and Nano-scale Microanalysis of the Titanium/Silicon Interfacial Reaction Correlated with Electrical Properties", S. Ogawa, T. Kouzaki, T. Yoshida and R. Sinclair, Proc. I.C.S.S.D.M. '90, 22, pp. 429-432 (1990).
80. "Structure and Thermodynamics of Amorphous Titanium-Silicon Produced by Solid- State Interdiffusion", K. Holloway, P. Moine, J. Delage, R. Bormann, R. Sinclair and L. Capuano, Mat. Res. Soc. Symp. Proc., 187, pp. 71-76 (1991).
81. "An In Situ HREM Study of Crystal Nucleation in Amorphous Silicon Thin Films", A.S. Kirtikar, J. Morgiel, R. Sinclair, I.W. Wu and A. Chiang, Mat. Res. Soc. Symp. Proc., 202, pp. 627-632 (1991).
82. "Low-Temperature Reactions at Metal-Semiconductor Interfaces", R. Sinclair, T.J. Konno, D.H. Ko and S. Ogawa, Inst. Phys. Conf. Ser. 117, pp. 283-287 (1991).
83. "In Situ Heating Studies at High Resolution", R. Sinclair, 49th Proc. EMSA, pp. 656-657 (1991).
84. "Crystallization of Amorphous Si in Si/Al Multilayers", T.J. Konno and R. Sinclair, 49th Proc. EMSA, pp. 824-825 (1991).
85. "Amorphous-Phase Formation and Initial Reactions at Pt/GaAs Interfaces", D.H. Ko and R. Sinclair, 49th Proc. EMSA, pp. 858-859 (1991).
86. "Reaction and Stability at Material Interfaces", R. Sinclair, 25th Proc. MAS 26, pp. 229-231 (1991).
87. "Evidence for a Grain Boundary Grooving Model of Agglomeration in Polycrystalline TiSi2 Thin Films", T. Nolan, R. Beyers and R. Sinclair, Mat. Res. Soc. Symp. Proc., 202, pp. 95-100 (1991).
88. "A Highly Reliable Sub-Half Micron Via and Interconnect Technology Using Al Alloy High-Temperature Sputter Filling", H. Nishimura, T. Yamada, R. Sinclair and S. Ogawa, VLSI Tech. Dig., pp. 74-75 (1992).
89. "Reaction and Stability at VLSI Contact Interfaces", S. Ogawa and R. Sinclair, Jpn. Soc. Appl. Phys., Catalog No. AP921108-00, 29p-NC-3, pp. 1268 (1992).
90. "Crystallization of Amorphous Si in Al/Si Multilayers", T.J. Konno and R. Sinclair, Mat. Res. Soc. Symp. Proc., 230, pp. 189-194 (1992).
91. "Amorphous Phase Formation and the Initial Reactions at Pt/GaAs Interfaces", D.H. Ko and R. Sinclair, Mat. Res. Soc. Symp. Proc., 230, pp. 33-38 (1992).
92. "Crystallization of Amorphous Silicon-Aluminum Thin Films: In-Situ Observation and Thermal Analysis", T.J. Konno and R. Sinclair, Mat. Res. Soc. Symp. Proc., 237, pp. 609-614 (1992).
93. "Reactions at Solid Interfaces", R. Sinclair, D.H. Ko, T.J. Konno and T.P. Nolan, Mat. Res. Soc. Symp. Proc., 238, pp. 269-272 (1992).
94. "Two-Step Martensitic Transformations in TiNi (10% Cu) Shape Memory Alloys", W.J. Moberly, T.W. Duerig, J.L. Proft and R. Sinclair, Mat. Res. Soc. Symp. Proc., 246, pp. 55-60 (1992).
95. "Pt/GaAs Interfacial Reactions: Ex-Situ and In-Situ Annealing TEM Study", D.H. Ko and R. Sinclair, Mat. Res. Soc. Symp. Proc., 260, in press (1992).
96. "Reaction and Stability at ULSI Circuit Interfaces", R. Sinclair and S. Ogawa, Mat. Res. Soc. Proc. ULSI-VII, pp. 273-276 (1992).
97. "Study of Semiconductor Metallization Problems by High Resolution Electron Microscopy and Thermodynamic Analysis", R. Sinclair, Proc. 3rd ICSICT, pp. 122-123 (1992).
98. "Transmission Electron Microscopy of Epitaxial Fe/Pt Multilayers", M.R. Visokay, B.M. Lairson, B.M. Clemens and R. Sinclair, J. Magn. Soc. Jap., 17, S1, pp. 113-116 (1993).
99. "Production of c-Axis Oriented PtFe Thin Film with Perpendicular Magnetic Anisotropy", B.M. Lairson, M.R. Visokay, R. Sinclair and B.M. Clemens, J. Magn. Soc. Jap., 17, S1, pp. 40-43 (1993).
100. "Reactions at the Ti-Si Interface Studied Using Hot Stage TEM", A.S. Kirtikar and R. Sinclair, Mat. Res. Soc. Symp. Proc., 260, pp. 227-231 (1993).
101. "In-Situ High Resolution Electron Microscopy of Metal-Contact Induced Crystallization of Semiconductors", T.J. Konno and R. Sinclair, Inst. Phys. Conf. Ser. 134, pp. 173-176 (1993).
102. "Reactions in Metal-Metalloid Multilayers", R. Sinclair and T.J. Konna, Mat. Res. Soc. Symp. Proc., 311, pp. 3-8 (1993).
103. "Crystallization of Amorphous Germanium in Silver-Germanium Layered Systems", T.J. Konno and R. Sinclair, Mat. Res. Soc. Symp. Proc., 311, pp. 99-104 (1993).
104. "Structure and Magnetic Properties of Fe/Zr Multilayer Films", T.J. Konno, T. Nakayama, B.M. Clemens and R. Sinclair, Mat. Res. Soc. Symp. Proc., 313, pp. 731-736 (1993).
105. "Deposition of Barium Ferrite Thin Films by RF Off-Axis Magnetron Sputtering", J. Li, R. Sinclair, S.S. Rosenblum and H. Hayashi, 3rd Euro. Ceram. Soc. Conf. Proc., 2, pp. 751-756 (1993).
106. "A Solid State Electrochemical Technique to Study Barium Ferrite Thermodynamic Stability". J. Li, T.M. Gur, R. Sinclair, S.S. Rosenblum and H. Hayashi, 3rd Euro. Ceram. Soc. Conf. Proc., 2, pp. 413-418 (1993).
107. "Correlation of Microstructural and Magnetic Properties of Longitudinal Recording Media Using TEM", T.P. Nolan, R. Sinclair, T. Yamashita and R. Ranjan, 51st Proc. MSA, pp. 1016-1017 (1993).
108. "Grain Separation Enhanced Magnetic Coercivity in Pt/Co Multilayers", G.A. Bertero and R. Sinclair, 51st Proc. MSA, pp.1038-1039 (1993).
109. "In Situ HREM of Interface Reactions", R. Sinclair and T.J. Konno, 51st Proc. MSA, pp. 830-831 (1993).
110. "Transmission Electron Microscopy Study of PtCo(001) and PtFe(001) Films Formed from Epitaxial Pt/Co and Pt/Fe Multilayers", M.R. Visokay, B.M. Lairson, B.M. Clemens and R. Sinclair, Mat. Res. Soc. Symp. Proc., 311, pp. 15-20 (1993).
111. "Evolution of Gd Thin Film Structure Due to Amorphization by Co-Deposition", T.C. Hufnagel, G.A. Bertero, R. Sinclair and B.M. Clemens, Mat. Res. Soc. Symp. Proc., 311, pp. 73-78 (1993).
112. "Structural Properties of Uniaxial Tetragonal PtCo(001) and PtFe(001) Thin Films on MgO(001)", B.M. Lairson, M.R. Visokay, R. Sinclair, S.M. Brennan and B.M. Clemens , Mat. Res. Soc. Symp. Proc., 311, pp. 9-14 (1993).
113. "Magnetic and Magneto-Optic Properties of PtFe(001) and PtCo(001) Thin Films", B.M. Lairson, M.R. Visokay, R. Sinclair, and B.M. Clemens, Mat. Res. Soc. Symp. Proc., 313, pp. 805-810 (1993).
114. "Magnetic Properties and Crystallography of Selected Co/Pt Multilayers with Rare-Earth Doped Interface", G.A. Bertero and R. Sinclair, Mat. Res. Soc. Symp. Proc., 313, pp.817-822 (1993).
115. "Application of High Resolution Electron Microscopy to the Study of Magnetic Thin Films and Multilayers", R. Sinclair, T.P. Nolan, G.A. Bertero and M.R. Visokay, Mat. Res. Soc. Symp. Proc., 313, pp. 705-712 (1993).
116. "Real Time Lattice Imaging of Crystallization in Amorphous Silicon", J. Morgiel, I.W. Wu, A. Chiang and R. Sinclair, VIII El. Microsc. Conf. on Sol. St. Phys. Proc., pp. 131-139 (1993).
117. "TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions", R. Sinclair, T.J. Konno, and D.-H. Ko, Reactive Phase Formation at Interfaces and Diffusion Processes, eds. Y. Limoge and J.L. Bocquet, V. 155-156 of Materials Science Forum, Trans Tech Pub., pp. 111-120 (1994).
118. "Reactions at Semiconductor Metal Interfaces", R. Sinclair, T.J. Konno and D.-H. Ko, First International Symposium on Control of Semiconductor Interfaces, Elsevier, New York, pp. 247-254 (1994).
119. "Roughness Control and Electrical Properties of SiO2/Si (001) Interfaces", M. Niwa, K. Okada, T. Kouzaki and R. Sinclair, First International Symposium on Control of Semiconductor Interfaces, Elsevier, New York, pp. 405-410 (1994).
119. "Direct Solid State Phase Transformation from Co to Epitaxial CoSi2 in Co/Thin Ti/(100) Si Structure and its Application for Shallow Junction Formation", S. Ogawa, J.A. Fair, T. Kouzaki, R. Sinclair, E.C. Jones, N.W. Cheung and D.B. Fraser, Mat. Res. Soc. Symp. Proc., 320, pp. 355-360 (1993).
120. "Atomic-Order Planarization of Ultra-Thin SiO2/Si (001) Interfaces," M. Niwa, T. Kouzaki, K. Okada and R. Sinclair, Proc. SSDM '93, pp. 621-623 (1993).
121. "In Situ HREM of Phase Reactions", R. Sinclair, T.J. Konno and D.-H. Ko, Proc. ICEM XIII, pp. 429-430 (1994).
122. "Observation of Ferroelectric Domain Walls in KTP by HREM", E. Snoeck and R. Sinclair, Proc. ICEM XIII, pp. 233-234 (1994).
123. "Microscopic Interfacial Phenomena During Solid Phase Crystallization of Amorphous Silicon Thin Films: In-Situ CTEM and HREM Studies", J.P. Guillemet, B. de Mauduit, B. Peiraggi, R. Sinclair and T.J. Konno, Proc. ICEM XIII, pp. 449-450 (1994).
124. "In-Situ TEM Observation of Interfacial Reactions in the Zr/Si System", H. Tanaka, T.J. Konno and R. Sinclair, Mat. Res. Soc. Symp. Proc., 337, pp. 481-485 (1994).
125. "Transmission Electron Microscopy of MOCVD Titanium Nitride Films", T. Itoh, T.J. Konno, R. Sinclair, I.J.M.M. Raaijmakers and B.E. Roberts, Mat. Res. Soc. Symp. Proc., 337, pp. 735-740 (1994).
126. "Characterization of Sputtered Magnetic Barium-Ferrite Thin Films on Silicon Nitride Coated High Density Amorphous Carbon Substrates", J. Li, R. Sinclair, S.S. Rosenblum and H. Hayashi, Mat. Res. Soc. Symp. Proc., 341, pp. 59-64 (1994).
127. "Effect of Interlayers Upon Texture and Magnetic Properties in Co Alloy Multilayers for Longitudinal Magnetic Recording", M.R. Visokay, M. Kuwabara, H. Saffari, H. Hayashi, R. Sinclair and Y. Onishi, Mat. Res. Soc. Symp. Proc., 343, pp. 381-386 (1994).
128. "On The Perpendicular Magnetic Anisotropy of Co/Pt Multilayers: Structure-Property Relationships", G.A. Bertero and R. Sinclair, Mat. Res. Soc. Symp. Proc., 343, pp. 369-374 (1994).
129. "Correlation of Structure and Properties in Thin-Film Magnetic Media", T.P. Nolan, R. Sinclair, T. Yamashita, R. Ranjan, G. Tarnopolsky and W. Bennett, Mat. Res. Soc. Symp. Proc., 343, pp. 297-302 (1994).
130. "Atomically Layered Structures for Magnetic Information Storage", B.M. Lairson, M.R. Visokay, R. Sinclair. S.N. Brennan and B.M. Clemens, Mat. Res. Soc. Symp. Proc., 343, pp. 359-367 (1994).
131. "Effects of Substrate Temperature on Magnetic and Crystallographic Properties of Co-Cr-Pt/Cr Films Deposited by Laser Ablation Method", A. Ishikawa, Y. Shiroishi and R. Sinclair, Mat. Res. Soc. Symp. Proc., 343, pp. 345-350 (1994).
132. "Nickel Mediated Transformation of Amorphous Carbon to Graphite", T. Itoh and R. Sinclair, Mat. Res. Soc. Symp. Proc., 349, pp. 31-36 (1994).
133. "Correlation of Micro-structural, Micro-chemical and Micro-magnetic Properties of Longitudinal Recording Media Using CM20 FEG Lorentz TEM", T.P. Nolan, R. Sinclair, T. Yamashita and R. Ranjan, 52nd Proc. MSA, pp. 892-893 (1994).
134. "Formation of Epitaxial (001) Ordered FePd Films from Multilayer Precursors", M.R. Visokay, B.M. Lairson, B.M. Clemens and R. Sinclair, J. Mag. Soc. Jpn., 19, S1, pp. 399-403 (1995).
135. "(Pt/Co/Pt)/X Multilayer Thin Films for Magneto-Optic Media", G.A. Bertero and R. Sinclair, J. Mag. Soc. Jpn., 19, S1, pp. 201-204 (1995).
136. "Microstructural, Magnetic and Magneto-Optical Properties of (100) and (111) Oriented Thick 'FCC' Cobalt Single Crystal", M. Ozkan, T. Suzuki, D. Miller, A. Kellock, C.-A. Chang and R. Sinclair, J. Mag. Soc. Jpn., 19, S1, pp. 267-270 (1995).
137. "Interface Reaction Enhanced Epitaxial Growth of Barium Ferrite Magnetic Thin Films", J. Li, R. Sinclair, S.S. Rosenblum and H. Hayashi, Mat. Res. Soc. Symp. Proc., 357, pp. 165-170 (1995).
138. "In Situ Electron Microscopy and its Application to Semiconductor Reactions at High Resolution", R. Sinclair, Proc. MSA, 53, pp. 222-223 (1995).
139. "In Situ TEM Study of Reactions in Iron/Amorphous Carbon Layered Thin Films", T. Itoh and R. Sinclair, Mat. Res. Soc. Symp. Proc., 382, p. 45-50 (1995).
140. "Observation of Micromagnetic Structure in Computer Hard Disks by Lorentz Transmission Electron Microscopy",K. Tang, M.R. Visokay and R. Sinclair, Mat. Res. Soc. Symp. Proc., 384, p. 21-26 (1995).
141. "Growth and Characterization of FePt Compound Thin Films", M.R. Visokay and R. Sinclair, Mat. Res. Soc. Symp. Proc., 384, p. 91-96 (1995).
142. "TEM study of Crystallization of a-SiC in Contact with Silver", N.C. Zhu and R. Sinclair, Mat. Res. Soc. Symp. Proc., 382, pp. 206-209 (1995).
143. "Study of Diffusion Barrier Performance of MOCVD-TiN", H.-J. Lee, R. Sinclair, B.E. Roberts and R. Jackson, Mat. Res. Soc. Symp. Proc., 391, pp. 205-209 (1995).
144. "Crystallization in Metal-Metalloid Multilayers", R. Sinclair, T.J. Konno, T. Itoh and N.C. Zhu, Mat. Res. Soc. Symp. Proc., 382, pp. 3-8 (1995).
145. "HREM of Ultra-thin Oxides", R. Sinclair, M. Niwa and T. Kouzaki, Proc. 4th ICSICT, Publishing House of the Electronics Industry, China pp. 739-741 (1995).
146. "Strategies and Opportunities for In-Situ Electron Microscopy", R. Sinclair, 3rd Congreso de la Asociacion Mexicana de Microscopia, ed. E.M. Rivera Munoz, pp. 89-90, (1996).
147. "A Failure Mechanism of MOCVD TiN Diffusion Barriers at High Temperatures", H.-J. Lee, P. Li, B. Roberts and R. Sinclair, Mat. Res. Soc. Symp. Proc., 428, pp. 295-300, (1996).
148. "Structure-Property Relationships in Sputtered Magneto-optic Multilayers", R. Sinclair, G.A. Bertero and M.R. Visokay, 55th Proc. MSA, 3, pp. 397-398, (1997).
149. "Micromagnetic and Microstructure-Property Relationships in Magnetic Recording Media", R. Sinclair, K. Tang and S.E. McKinlay, 55th Proc. MSA, 3, pp. 513-514, (1997).
150. "Applications of TEM for Analysis of Local Failures Occurring During Si Metallization Process", H.-J. Lee and R. Sinclair, 55th Proc. MSA, 3, pp. 465-466, (1997).
151. "In Situ HREM of Reactions at Interfaces", R. Sinclair, T. Itoh, H.-J. Lee and K.W. Kwon, 55th Proc. MSA, 3, pp. 621-622 (1997).
152. "Characterization of Ta as an underlayer for Cu Interconnects", K.W. Kwon, H.-J. Lee, C. Ryu, R. Sinclair and S.S. Wong, Proc. Advanced Metallization for ULSI Applications, pp. 711-716 (1997).
153. "Diffusion Barrier Stability in ULSI Applications", R. Sinclair, H.-J. Lee and K.W. Kwon, Proc. 4th International Conference on Materials and Process Characterization for VLSI, Shanghai, China, pp. 305-308 (1997).
154. "Chromium Distrubution in CoCrTa/Cr Longitudinal Recording Media", J.E. Wittig, T.P. Nolan, R. Sinclair and J. Bentley, Mat. Res. Soc. Symp. Proc., 517, pp. 211-216 (1998).
155. "Roughness Measurements of Thin SiO2 and poly-Si Interfaces Using High Resolution Cross-Sectional TEM", M. Yamaguchi, R. Sinclair, and M. Niwa, Proc. of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films, pp. 232-239 (1998).
156. "Magnetic Imaging of Recording Media", R. Sinclair and K. Tang, Proc. Microscopy and Microanalysis, 5, pp. 28-29 (1999).
157. "Thermal Stability of the Copper/Tantalum Interfaces in Advanced Microelectronic Metallization", K.W. Kwon, H.-J. Lee, and R. Sinclair, Proc. Microscopy and Microanalysis, 5, pp. 176-177 (1999).
158. "In Situ HREM of Interface Reactions", R. Sinclair, Proc. 5th International Symp. on Advance Physical Fields, NRIM Japan, edited by K. Yoshihara, pp. 47-48 (2000).
159. "Grain Size Relationship Between the Magnetic Layer and the Underlayer in CoCrPtTa Recording Media", K. Ma, R. Sinclair, G. Bertero, and W. Cao, Mat. Res. Soc. Symp. Proc., 614, pp. 141-146 (2001).
160. "Microstructural Characterization of Longitudinal Magnetic Recording Media", R. Sinclair, D.W. Park, C. Habermeier, and K. Ma, Mat. Res. Soc. Proc., 589, pp. 3-12 (2001).
161. "Quantitative EFTEM of Cr Grain Boundary Segregation in CoCrTa", J.E. Wittig, J.F. Al-Sharab, J. Bentley, N.D. Evans, T.P. Nolan, and R. Sinclair, Proc. Microscopy and Microanalysis, 7, pp. 298-299 (2001).
162. "In Situ Transmission Electron Microscopy of Materials", R. Sinclair and K.H. Min, Proc. 2001 International Workshop on Adv. Microscopy, ed. L.J. Chen, pp. I-O-12-13 (2001).
163. "Transmission Electron Microscopy of Computer Hard Disc, Magnetic Thin Films", R. Sinclair, Proc. 4th International COE Symposium on Atomic Scale Processing and Novel Prop. in Nanoscopic Materials, ed. T. Kawaii, p. 12 (2001).
164. "In Situ HREM of Crystallization Reactions", R. Sinclair and K.H. Min, Proc. Microscopy and Microanalysis, 8, Supplement 2, pp. 416-417 (2002).
165. "TEM Microstructure Studies of Thin Film Magnetic Recording Media", R. Sinclair, U. Kwon and J.D. Risner, Proc. Microscopy and Microanalysis, 8, Supplement 2, pp. 368-369 (2002).
166. "In-Situ Heating Study of Materials", R. Sinclair and K.H. Min, Proc. ICEM XV, pp. 931-932 (2002).
167. "Reactions in Metal-Carbon Systems", R. Sinclair, T. Itoh and R. Chin, Proc. ICEM XV, pp. 153-154 (2002).
168. "Failure Analysis of Ferroelectric RAM Device by Transmission Electron Microscopy", H.S. Baik, G.S. Park, S.A. Song, J.K. Lee, and R. Sinclair, Proc. ICEM XV, pp. 805-806 (2002).
169. "Characterization for crystallization of SrBi2Nb2O9 thin films on Si substrates", D.C. Yoo, J.Y. Lee, R. Sinclair, I.S. Kim, Y.T. Kim, J. Korean Phys. Soc., 42 Supp (1), pp. S450-453 (2003).
170. "High Resolution and Analytical TEM of Cr Grain Boundary Segregation in Co-alloy Longitudinal Hard Disk Magnetic Recording Media", J. Risner, R. Sinclair and J. Bentley, Proc. Microscopy and Microanalysis, 10, Supplement 2, pp. 14-15 (2004).
171. "High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media", J.D. Risner, T.P. Nolan, J. Bentley, S.Z. Wu, S.D. Harkness, and R. Sinclair, Proc. Microscopy and Microanalysis, 11, Supplement 2, pp. 1806-1807 (2005).
172. "HRTEM and Nano-probe EDS Studies on the Microstructure of CoCrPtO Perpendicular Recording Media with Ru/Ru-oxide Interlayers", U. Kwon, and R. Sinclair, Proc. Microscopy and Microanalysis, 11, Supplement 2, pp. 1834-1835 (2005).
173. "Synthesis and Characterization of Fe-C Core-shell Nanoparticles", H. Li, H. Dai, and R. Sinclair, Proc. Microscopy and Microanalysis, 11, Supplement 2, pp. 1902-1903 (2005).
174. "Characterization of AuFe-C Core-shell Nanoparticles", H. Li, H. Dai, L. Xing, and R. Sinclair, Proc. Microscopy and Microanalysis, 12, Supplement 2, pp. 524CD-525CD (2006).
175. "Information Storage Technology: The Role of the TEM", R. Sinclair, J. Risner, and U. Kwon, Proc. Microscopy and Microanalysis, 12, Supplement 2, pp. 76-77 (2006).
176. "TEM Studies of Reactions in Thin Films and their Interfaces", R. Sinclair, Proc. ICEM XVI, p. 1322 (2006).
177. "FIB and TEM Studies of Interface Structure in Diamond-SiC Composites", J.S. Park, R. Sinclair, D. Rowcliffe, M. Stern, and H. Davidson, Proc. ICEM XVI, p. 1965 (2006).
178. "TEM Observations of Bio-conjugated Streptavidin-Gold Particles", A. L. Koh and R. Sinclair, Mat. Res. Soc. Symp. Proc., 1019E, p. 1019-FF05-01 (2007).
179. "TEM Studies of Iron Oxide Nanoparticles for Cell Labeling and Magnetic Separation", A. L. Koh and R. Sinclair, Technical Proceedings of the 2007 Nanotechnology Conference and Trade Show, 4, pp. 101-104 (2007).
180. "Grain Size Distribution in CoCrPtO-based Perpendicular Magnetic Recording Media", F. Hossein-Babaei, U. Kwon and R. Sinclair, Technical Proceedings of the 2007 Nanotechnology Conference and Trade Show, 4, pp. 547-550 (2007).
181. "Characterization of Magnetic Nanoparticles by High Resolution TEM Methods", R. Sinclair, H. Li and A. L. Koh, Proc. Microscopy and Microanalysis, 13, Supplement 2, p. 66CD (2007).
182. "TEM Studies of Synthetic Anti-ferromagnetic (SAF) Nanoparticles", A. L. Koh, W. Hu, R. Wilson, S. X. Wang, and R. Sinclair, Proc. Microscopy and Microanalysis, 13, Supplement 2, p. 622CD (2007).
183. "Electron Microscopy Characterization of Composite Organic-Inorganic Nanoparticles (COINs) as Raman Labels for Extra-Cellular Analyses", A. L. Koh, C.M. Shachaf, S. Elchuri, G.P. Nolan and R. Sinclair, Microsc. Microanal. 14, Supplement 2, p. 670CD (2008).
184. "Electron Energy-Loss Spectrometry (EELS) and Energy-Filtered TEM (EFTEM) Analyses of Organic-Inorganic Nanoparticles", A.L. Koh, M. Watanabe and R. Sinclair, Microsc. Microanal. 15 (Suppl. 2) p.432CD (2009).
185. "In Situ and High Resolution TEM Studies of Nano-scale Materials", R. Sinclair, A.L. Koh, P.J. Kempen and H.J. Jung, Microscopy and Microanalysis 2009 Meeting, Microsc. Microanal. 15 (Suppl. 2) p. 1200CD (2009).
186. "Organic-Inorganic Particles as Labels to Trace Biological Signaling Pathways", A. L. Koh and R. Sinclair, , Microsc. Microanal. 16 (Suppl. 2) pp. 1130-1131 (2010).
187. "Electron Microscopy Investigations of Surface-Enhanced Raman Scattering (SERS) Nanoparticles and Their Applications to Cancer Detection", A.L. Koh and R. Sinclair, IMC XVII, M16.15 (2010).
188. "TEM Study on PbS Quantum Dots Made by Atomic Layer Deposition and Their Behavior Under E-beam Irradiation", H. J. Jung, N. P. Dasgupta, F.z B. Prinz and R. Sinclair, Microsc. Microanal. 16 (Suppl 2), pp 1376-1377 (2010).
189. "Nanostructural correlation between Co magnetic layer and its Ru seed layer in a PMR medium", F. Hossein-Babaei (Jr.), R. Sinclair, G. Bertero, and K. Srinivasan, Microsc. Microanal. 16 (Suppl. 2), pp. 1522-1523 (2010).
190. "Utilizing Scanning Transmission Electron Microscopy to Locate and Image Raman Active Gold Core Nanoparticles in Mouse Tissue", P.J. Kempen, A.S. Thakor, C.L.Zavaleta, S.S. Gambhir, and R. Sinclair, Microsc. Microanal. 16 (Suppl. 2) pp. 1116-1117 (2010).
191. "Utilizing Scanning Transmission Electron Microscopy to Locate and Image Raman Active Gold Core Nanoparticles in Mouse Tissue", P.J. Kempen, A.S. Thakor, C.L.Zavaleta, S.S. Gambhir, and R. Sinclair, IMC XVII, M16.4 (2010).